25 Feb 10 EUV metrology R&D doesn't add up

The numbers for the development of future EUV mask and metrology tools do not add up, according to experts at the SPIE Advanced Lithography event here.



Technology - SPIE - Metrology - Business - Industrial Goods and Services
Tagi: metrology tools, lithography, mask

15 Jul 10 DarbeeVision aims to be Dolby of video

DarbeeVision does for video what Dolby did for audio--enhance the perception of 3-D depth while suppressing the artifacts associated with similar effects like "unsharp mask" in Photoshop.
Tagi: artifacts, mask